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      扫描电镜(Scanning Electron Microscope,简写为SEM)是一个庞大的体系,稀释了电子光学手艺、真空技术、邃密机器构造和当代计算机控制手艺。成像是接纳二次电子或背散射电子等事情体式格局。扫描电镜生长至今,一样平常将扫描电镜装备多种附加仪器组成剖析型扫描电镜,以便对被测试样停止多种信息的剖析,其附件一样平常能谱仪(EDS)、电子背散射衍射(EBSD)和波谱仪(WDS)等附件。

     Scanning Electron Microscope (SEM) is a complex system that concentrates electronic optical technology, vacuum technology, fine mechanical structure and modern computer control technology. Imaging is the use of secondary or backscattering electron and other working methods. Scanning electron microscopy (sem) development up to now, the scanning electron microscopy (sem) equipped with a variety of additional instruments analytical scanning electron microscopy (sem), the analysis of the sample to be tested in a variety of information, the attachment generally spectrometer (EDS), the test results with electron backscattered diffraction (EBSD) and electron back scattering diffraction spectrometer (WDS), and other accessories.


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